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Markus Bosund
Markus Bosund
Senior Manager, Afly Solution
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Properties of AlN grown by plasma enhanced atomic layer deposition
M Bosund, T Sajavaara, M Laitinen, T Huhtio, M Putkonen, VM Airaksinen, ...
Applied Surface Science 257 (17), 7827-7830, 2011
1522011
Thermal and plasma enhanced atomic layer deposition of SiO2 using commercial silicon precursors
M Putkonen, M Bosund, OME Ylivaara, RL Puurunen, L Kilpi, ...
Thin Solid Films 558, 93-98, 2014
912014
GaAs surface passivation by plasma-enhanced atomic-layer-deposited aluminum nitride
M Bosund, P Mattila, A Aierken, T Hakkarainen, H Koskenvaara, ...
Applied Surface Science 256 (24), 7434-7437, 2010
612010
Atomic layer deposited TiO2 films in photodegradation of aqueous salicylic acid
S Vilhunen, M Bosund, ML Kääriäinen, D Cameron, M Sillanpää
Separation and Purification Technology 66 (1), 130-134, 2009
602009
Atomic Layer Deposition Al2O3 Coatings Significantly Improve Thermal, Chemical, and Mechanical Stability of Anodic TiO2 Nanotube Layers
R Zazpe, J Prikryl, V Gärtnerova, K Nechvilova, L Benes, L Strizik, ...
Langmuir 33 (13), 3208-3216, 2017
552017
Ytterbium-doped fibers fabricated with atomic layer deposition method
JJM i Ponsoda, L Norin, C Ye, M Bosund, MJ Söderlund, A Tervonen, ...
Optics Express 20 (22), 25085-25095, 2012
432012
Nonlinear fitness–space–structure adaptation and principal component analysis in genetic algorithms: an application to x-ray reflectivity analysis
J Tiilikainen, JM Tilli, V Bosund, M Mattila, T Hakkarainen, VM Airaksinen, ...
Journal of Physics D: Applied Physics 40 (1), 215, 2006
312006
HOR activity of Pt-TiO2-Y at unconventionally high potentials explained: the influence of SMSI on the electrochemical behavior of Pt
TN Geppert, M Bosund, M Putkonen, BM Stühmeier, AT Pasanen, ...
Journal of The Electrochemical Society 167 (8), 084517, 2020
302020
Atomic layer deposition of ytterbium oxide using β-diketonate and ozone precursors
M Bosund, K Mizohata, T Hakkarainen, M Putkonen, M Söderlund, ...
Applied surface science 256 (3), 847-851, 2009
292009
Genetic algorithm using independent component analysis in x-ray reflectivity curve fitting of periodic layer structures
J Tiilikainen, V Bosund, JM Tilli, J Sormunen, M Mattila, T Hakkarainen, ...
Journal of Physics D: Applied Physics 40 (19), 6000, 2007
292007
Passivation of GaAs surface by atomic-layer-deposited titanium nitride
M Bosund, A Aierken, J Tiilikainen, T Hakkarainen, H Lipsanen
Applied surface science 254 (17), 5385-5389, 2008
262008
Effect of growth temperature on the epitaxial growth of ZnO on GaN by ALD
S Särkijärvi, S Sintonen, F Tuomisto, M Bosund, S Suihkonen, H Lipsanen
Journal of crystal growth 398, 18-22, 2014
242014
Accuracy in x-ray reflectivity analysis
J Tiilikainen, JM Tilli, V Bosund, M Mattila, T Hakkarainen, J Sormunen, ...
Journal of Physics D: Applied Physics 40 (23), 7497, 2007
232007
High-k GaAs metal insulator semiconductor capacitors passivated by ex-situ plasma-enhanced atomic layer deposited AlN for Fermi-level unpinning
H Jussila, P Mattila, J Oksanen, A Perros, J Riikonen, M Bosund, ...
Applied Physics Letters 100 (7), 2012
222012
Fitness function and nonunique solutions in x-ray reflectivity curve fitting: crosserror between surface roughness and mass density
J Tiilikainen, V Bosund, M Mattila, T Hakkarainen, J Sormunen, ...
Journal of Physics D: Applied Physics 40 (14), 4259, 2007
222007
Plasma etch characteristics of aluminum nitride mask layers grown by low-temperature plasma enhanced atomic layer deposition in SF6 based plasmas
A Perros, M Bosund, T Sajavaara, M Laitinen, L Sainiemi, T Huhtio, ...
Journal of Vacuum Science & Technology A 30 (1), 2012
152012
Comparison of ammonia plasma and AlN passivation by plasma-enhanced atomic layer deposition
P Mattila, M Bosund, T Huhtio, H Lipsanen, M Sopanen
Journal of Applied Physics 111 (6), 2012
132012
ATOMIC LAYER DEPOSITION HfO2 FILM USED AS BUFFER LAYER OF THE Pt/(Bi0.95Nd0.05)(Fe0.95Mn0.05)O3/HfO2/Si CAPACITORS FOR FeFET …
DAN XIE, T FENG, Y LUO, X Han, T REN, M Bosund, S LI, VM Airaksinen, ...
Journal of Advanced Dielectrics 1 (03), 369-377, 2011
92011
Tribological properties of thin films made by atomic layer deposition sliding against silicon
L Kilpi, OME Ylivaara, A Vaajoki, X Liu, V Rontu, S Sintonen, E Haimi, ...
Journal of Vacuum Science & Technology A 36 (1), 2018
72018
Comparative study and characterization of atomic layer deposition Al2O3 films as metal-insulator-metal capacitor dielectric for GaAs hetero-junction bipolar transistor technology
J Yota, M Janani, HM Banbrook, P Rabinzohn, M Bosund
Journal of Vacuum Science & Technology A 37 (5), 2019
62019
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Artículos 1–20