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Jan Dennis Reimer
Jan Dennis Reimer
PhD Student
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Problem solving by SEM in IC wafer fabrication
J Reimer
Scanning Electron Microscopy 1, 167-176, 1977
51977
Variation-Aware Test for Logic Interconnects using Neural Networks–A Case Study
A Sprenger, S Sadeghi-Kohan, JD Reimer, S Hellebrand
2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2020
42020
Approximate Communication: Balancing Performance, Power, Reliability, and Safety
A Badran, S Sadeghi-Kohan, JD Reimer, S Hellebrand
2023 IEEE European Test Symposium (ETS), 1-6, 2023
32023
Logic fault diagnosis of hidden delay defects
S Holst, M Kampmann, A Sprenger, JD Reimer, S Hellebrand, ...
2020 IEEE International Test Conference (ITC), 1-10, 2020
22020
Optimizing the Streaming of Sensor Data with Approximate Communication
S Sadeghi-Kohan, JD Reimer, S Hellebrand, HJ Wunderlich
2023 IEEE 32nd Asian Test Symposium (ATS), 1-6, 2023
2023
Robust Pattern Generation for Small Delay Faults Under Process Variations
H Jafarzadeh, F Klemme, JD Reimer, ZP Najafi-Haghi, H Amrouch, ...
2023 IEEE International Test Conference (ITC), 111-116, 2023
2023
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