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Francisco Yubero
Francisco Yubero
Tenured scientist
Verified email at icmse.csic.es
Title
Cited by
Cited by
Year
Model for quantitative analysis of reflection-electron-energy-loss spectra
F Yubero, S Tougaard
Physical Review B 46 (4), 2486, 1992
3101992
Model for quantitative analysis of reflection-electron-energy-loss spectra: Angular dependence
F Yubero, JM Sanz, B Ramskov, S Tougaard
Physical Review B 53 (15), 9719, 1996
2051996
Determination of the Cu 2p primary excitation spectra for Cu, Cu2O and CuO
N Pauly, S Tougaard, F Yubero
Surface Science 620, 17-22, 2014
1992014
Electron inelastic mean free path for Ti, TiC, TiN and TiO2 as determined by quantitative reflection electron energy‐loss spectroscopy
GG Fuentes, E Elizalde, F Yubero, JM Sanz
Surface and Interface Analysis: An International Journal devoted to the …, 2002
1392002
XPS analysis of down stream plasma treated wool: Influence of the nature of the gas on the surface modification of wool
R Molina, JP Espinós, F Yubero, P Erra, AR Gonzalez-Elipe
Applied Surface Science 252 (5), 1417-1429, 2005
1212005
Quantitative model of electron energy loss in XPS
AC Simonsen, F Yubero, S Tougaard
Physical Review B 56 (3), 1612, 1997
1211997
Non-enzymatic glucose electrochemical sensor made of porous NiO thin films prepared by reactive magnetron sputtering at oblique angles
FJ García-García, P Salazar, F Yubero, AR González-Elipe
Electrochimica Acta 201, 38-44, 2016
1102016
Dielectric loss function of Si and SiO2 from quantitative analysis of REELS spectra
F Yubero, S Tougaard, E Elizalde, JM Sanz
Surface and interface analysis 20 (8), 719-726, 1993
1001993
Preparation of transparent and conductive Al-doped ZnO thin films by ECR plasma enhanced CVD
A Martın, JP Espinos, A Justo, JP Holgado, F Yubero, AR González-Elipe
Surface and coatings Technology 151, 289-293, 2002
982002
Electronic state characterization of SiOx thin films prepared by evaporation
A Barranco, F Yubero, JP Espinós, P Gröning, AR González-Elipe
Journal of applied physics 97 (11), 2005
952005
SiO2/TiO2 thin films with variable refractive index prepared by ion beam induced and plasma enhanced chemical vapor deposition
F Gracia, F Yubero, JP Holgado, JP Espinos, AR Gonzalez-Elipe, ...
Thin Solid Films 500 (1-2), 19-26, 2006
932006
Low energy ion assisted film growth
A Gonzalez-elipe, JM Sanz, F Yubero
World Scientific, 2003
872003
Synthesis of SiO2 and SiOxCyHz thin films by microwave plasma CVD
A Barranco, J Cotrino, F Yubero, JP Espinós, J Benıtez, C Clerc, ...
Thin solid films 401 (1-2), 150-158, 2001
822001
QUEELS software package for calculation of surface effects in electron spectra
S Tougaard, F Yubero
Surface and Interface Analysis: An International Journal devoted to the …, 2004
802004
Chemical stability of species in thin films
A Barranco, JA Mejıas, JP Espinos, A Caballero, AR Gonzalez-Elipe, ...
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 19 (1 …, 2001
782001
Quantification of plasmon excitations in core-level photoemission
F Yubero, S Tougaard
Physical Review B 71 (4), 045414, 2005
752005
Interface effects in the Ni 2 p x-ray photoelectron spectra of NiO thin films grown on oxide substrates
I Preda, A Gutiérrez, M Abbate, F Yubero, J Méndez, L Alvarez, L Soriano
Physical Review B 77 (7), 075411, 2008
742008
Experimental test of model for angular and energy dependence of reflection-electron-energy-loss spectra
F Yubero, D Fujita, B Ramskov, S Tougaard
Physical Review B 53 (15), 9728, 1996
711996
Structure, microstructure and electronic characterisation of the Al2O3/SiO2 interface by electron spectroscopies
R Reiche, F Yubero, JP Espinós, AR González-Elipe
Surface Science 457 (1-2), 199-210, 2000
672000
Quantitative analysis of reflection electron energy‐loss spectra
F Yubero, S Tougaard
Surface and interface analysis 19 (1‐12), 269-273, 1992
641992
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Articles 1–20