The 2018 GaN power electronics roadmap H Amano, Y Baines, E Beam, M Borga, T Bouchet, PR Chalker, M Charles, ...
Journal of Physics D: Applied Physics 51 (16), 163001, 2018
1069 2018 Silicon substrate removal of GaN DHFETs for enhanced (< 1100 V) breakdown voltage P Srivastava, J Das, D Visalli, J Derluyn, M Van Hove, PE Malinowski, ...
IEEE Electron Device Letters 31 (8), 851-853, 2010
255 2010 Forward bias gate breakdown mechanism in enhancement-mode p-GaN gate AlGaN/GaN high-electron mobility transistors TL Wu, D Marcon, S You, N Posthuma, B Bakeroot, S Stoffels, ...
IEEE Electron device letters 36 (10), 1001-1003, 2015
195 2015 AlGaN/GaN-based HEMTs failure physics and reliability: Mechanisms affecting gate edge and Schottky junction E Zanoni, M Meneghini, A Chini, D Marcon, G Meneghesso
IEEE Transactions on Electron Devices 60 (10), 3119-3131, 2013
168 2013 Time-dependent degradation of AlGaN/GaN high electron mobility transistors under reverse bias M Meneghini, A Stocco, M Bertin, D Marcon, A Chini, G Meneghesso, ...
Applied Physics Letters 100 (3), 2012
154 2012 Record Breakdown Voltage (2200 V) of GaN DHFETs on Si With 2- P Srivastava, J Das, D Visalli, M Van Hove, PE Malinowski, D Marcon, ...
IEEE Electron Device Letters 32 (1), 30-32, 2010
154 2010 Low on-resistance high-breakdown normally off AlN/GaN/AlGaN DHFET on Si substrate F Medjdoub, J Derluyn, K Cheng, M Leys, S Degroote, D Marcon, D Visalli, ...
IEEE electron device letters 31 (2), 111-113, 2010
138 2010 Negative bias-induced threshold voltage instability in GaN-on-Si power HEMTs M Meneghini, I Rossetto, D Bisi, M Ruzzarin, M Van Hove, S Stoffels, ...
IEEE Electron Device Letters 37 (4), 474-477, 2016
117 2016 Kinetics of Buffer-Related RON -Increase in GaN-on-Silicon MIS-HEMTs D Bisi, M Meneghini, FA Marino, D Marcon, S Stoffels, M Van Hove, ...
IEEE Electron Device Letters 35 (10), 1004-1006, 2014
114 2014 A comprehensive reliability investigation of the voltage-, temperature-and device geometry-dependence of the gate degradation on state-of-the-art GaN-on-Si HEMTs D Marcon, T Kauerauf, F Medjdoub, J Das, M Van Hove, P Srivastava, ...
2010 International Electron Devices Meeting, 20.3. 1-20.3. 4, 2010
112 2010 Trapping and reliability assessment in D-mode GaN-based MIS-HEMTs for power applications M Meneghini, D Bisi, D Marcon, S Stoffels, M Van Hove, TL Wu, ...
IEEE Transactions on Power Electronics 29 (5), 2199-2207, 2013
101 2013 Analysis of the gate capacitance–voltage characteristics in p-GaN/AlGaN/GaN heterostructures TL Wu, B Bakeroot, H Liang, N Posthuma, S You, N Ronchi, S Stoffels, ...
IEEE Electron Device Letters 38 (12), 1696-1699, 2017
90 2017 PBTI in GaN-HEMTs With p-Type Gate: Role of the Aluminum Content on AN Tallarico, S Stoffels, N Posthuma, P Magnone, D Marcon, S Decoutere, ...
IEEE Transactions on Electron Devices 65 (1), 38-44, 2017
87 2017 Trapping mechanisms in GaN‐based MIS‐HEMTs grown on silicon substrate D Bisi, M Meneghini, M Van Hove, D Marcon, S Stoffels, TL Wu, ...
physica status solidi (a) 212 (5), 1122-1129, 2015
87 2015 Reliability analysis of permanent degradations on AlGaN/GaN HEMTs D Marcon, G Meneghesso, TL Wu, S Stoffels, M Meneghini, E Zanoni, ...
IEEE Transactions on Electron Devices 60 (10), 3132-3141, 2013
86 2013 Trapping in GaN-based metal-insulator-semiconductor transistors: Role of high drain bias and hot electrons M Meneghini, D Bisi, D Marcon, S Stoffels, M Van Hove, TL Wu, ...
Applied Physics Letters 104 (14), 2014
83 2014 GaN-on-SOI: Monolithically integrated all-GaN ICs for power conversion X Li, N Amirifar, K Geens, M Zhao, W Guo, H Liang, S You, N Posthuma, ...
2019 IEEE International Electron Devices Meeting (IEDM), 4.4. 1-4.4. 4, 2019
78 2019 200mm GaN-on-Si epitaxy and e-mode device technology D Marcon, YN Saripalli, S Decoutere
2015 IEEE International Electron Devices Meeting (IEDM), 16.2. 1-16.2. 4, 2015
77 2015 Correlation of interface states/border traps and threshold voltage shift on AlGaN/GaN metal-insulator-semiconductor high-electron-mobility transistors TL Wu, D Marcon, B Bakeroot, B De Jaeger, HC Lin, J Franco, S Stoffels, ...
Applied Physics Letters 107 (9), 2015
74 2015 Reliability of AlGaN/GaN HEMTs: Permanent leakage current increase and output current drop D Marcon, J Viaene, P Favia, H Bender, X Kang, S Lenci, S Stoffels, ...
Proceedings of the 20th IEEE International Symposium on the Physical and …, 2013
72 2013 