| Switching of ferroelectric polarization in epitaxial BaTiO3 films on silicon without a conducting bottom electrode C Dubourdieu, J Bruley, TM Arruda, A Posadas, J Jordan-Sweet, ... Nature Nanotechnology 8 (10), 748, 2013 | 302 | 2013 |
| Crystallization properties of ultrathin phase change films S Raoux, JL Jordan-Sweet, AJ Kellock Journal of Applied Physics 103 (11), 2008 | 257 | 2008 |
| An off-normal fibre-like texture in thin films on single-crystal substrates C Detavernier, AS Özcan, J Jordan-Sweet, EA Stach, J Tersoff, FM Ross, ... Nature 426 (6967), 641-645, 2003 | 234 | 2003 |
| Orthorhombic Distortion at the Superconducting Transition in Y: Evidence for Anisotropic Pairing PM Horn, DT Keane, GA Held, JL Jordan-Sweet, DL Kaiser, F Holtzberg, ... Physical review letters 59 (24), 2772, 1987 | 205 | 1987 |
| In-situ X-ray diffraction study of metal induced crystallization of amorphous silicon W Knaepen, C Detavernier, RL Van Meirhaeghe, JJ Sweet, C Lavoie Thin Solid Films 516 (15), 4946-4952, 2008 | 198 | 2008 |
| Phase change materials and their application to random access memory technology S Raoux, RM Shelby, J Jordan-Sweet, B Munoz, M Salinga, YC Chen, ... Microelectronic Engineering 85 (12), 2330-2333, 2008 | 192 | 2008 |
| Solution-phase deposition and nanopatterning of GeSbSe phase-change materials DJ Milliron, S Raoux, RM Shelby, J Jordan-Sweet Nature Materials 6 (5), 352-356, 2007 | 178 | 2007 |
| Effects of additive elements on the phase formation and morphological stability of nickel monosilicide films C Lavoie, C Detavernier, C Cabral Jr, FM d’Heurle, AJ Kellock, ... Microelectronic engineering 83 (11-12), 2042-2054, 2006 | 149 | 2006 |
| X-ray scattering study of the thermal roughening of Ag (110) GA Held, JL Jordan-Sweet, PM Horn, A Mak, RJ Birgeneau Physical review letters 59 (18), 2075, 1987 | 141 | 1987 |
| Direct observation of amorphous to crystalline phase transitions in nanoparticle arrays of phase change materials S Raoux, CT Rettner, JL Jordan-Sweet, AJ Kellock, T Topuria, PM Rice, ... Journal of Applied Physics 102 (9), 2007 | 138 | 2007 |
| In situ x-ray diffraction study of metal induced crystallization of amorphous germanium W Knaepen, S Gaudet, C Detavernier, RL Van Meirhaeghe, JJ Sweet, ... Journal of Applied Physics 105 (8), 2009 | 129 | 2009 |
| Small-angle x-ray-scattering study of ordering kinetics in a block copolymer CR Harkless, MA Singh, SE Nagler, GB Stephenson, JL Jordan-Sweet Physical review letters 64 (19), 2285, 1990 | 117 | 1990 |
| Phase transitions in Ge–Sb phase change materials S Raoux, C Cabral, L Krusin-Elbaum, JL Jordan-Sweet, K Virwani, ... Journal of Applied Physics 105 (6), 2009 | 106 | 2009 |
| Relaxed Si0.7Ge0.3 buffer layers for high‐mobility devices PM Mooney, JL Jordan‐Sweet, K Ismail, JO Chu, RM Feenstra, ... Applied physics letters 67 (16), 2373-2375, 1995 | 105 | 1995 |
| Effect of Al and Cu doping on the crystallization properties of the phase change materials SbTe and GeSb S Raoux, M Salinga, JL Jordan-Sweet, A Kellock Journal of Applied Physics 101 (4), 2007 | 104 | 2007 |
| Phase formation and thermal stability of ultrathin nickel-silicides on Si (100) K De Keyser, C Van Bockstael, RL Van Meirhaeghe, C Detavernier, ... Applied Physics Letters 96 (17), 2010 | 99 | 2010 |
| Phase transitions in Ge–Te phase change materials studied by time-resolved x-ray diffraction S Raoux, B Muņoz, HY Cheng, JL Jordan-Sweet Applied Physics Letters 95 (14), 2009 | 94 | 2009 |
| Nucleated and continuous ordering in Cu 3 Au KF Ludwig Jr, GB Stephenson, JL Jordan-Sweet, J Mainville, YS Yang, ... Physical review letters 61 (16), 1859, 1988 | 90 | 1988 |
| In situ x‐ray diffraction analysis of the C49–C54 titanium silicide phase transformation in narrow lines RA Roy, LA Clevenger, C Cabral Jr, KL Saenger, S Brauer, ... Applied physics letters 66 (14), 1732-1734, 1995 | 83 | 1995 |
| Influence of interfaces and doping on the crystallization temperature of Ge–Sb S Raoux, HY Cheng, JL Jordan-Sweet, B Munoz, M Hitzbleck Applied Physics Letters 94 (18), 2009 | 81 | 2009 |
Christian LavoieManager Advanced Characterization, IBM T.J. Watson Research Center, Yorktown Heights, NYVerified email at us.ibm.com
