| Simulated annealing analysis of Rutherford backscattering data NP Barradas, C Jeynes, RP Webb Applied Physics Letters 71 (2), 291-293, 1997 | 786 | 1997 |
| Elemental thin film depth profiles by ion beam analysis using simulated annealing-a new tool C Jeynes, NP Barradas, PK Marriott, G Boudreault, M Jenkin, E Wendler, ... Journal of physics D: applied physics 36 (7), R97, 2003 | 231 | 2003 |
| “Total IBA”–Where are we? C Jeynes, MJ Bailey, NJ Bright, ME Christopher, GW Grime, BN Jones, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2012 | 147 | 2012 |
| Rapid detection of cocaine, benzoylecgonine and methylecgonine in fingerprints using surface mass spectrometry MJ Bailey, R Bradshaw, S Francese, TL Salter, C Costa, M Ismail, ... Analyst 140 (18), 6254-6259, 2015 | 138 | 2015 |
| Chemical characterization of latent fingerprints by matrix-assisted laser desorption ionization, time-of-flight secondary ion mass spectrometry, mega electron volt secondary … MJ Bailey, NJ Bright, RS Croxton, S Francese, LS Ferguson, S Hinder, ... Analytical chemistry 84 (20), 8514-8523, 2012 | 130 | 2012 |
| The new Surrey ion beam analysis facility A Simon, C Jeynes, RP Webb, R Finnis, Z Tabatabaian, PJ Sellin, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2004 | 109 | 2004 |
| Enhanced imaging of developed fingerprints using mass spectrometry imaging MJ Bailey, M Ismail, S Bleay, N Bright, ML Elad, Y Cohen, B Geller, ... Analyst 138 (21), 6246-6250, 2013 | 80 | 2013 |
| Accurate RBS measurements of the indium content of InGaAs thin films C Jeynes, ZH Jafri, RP Webb, AC Kimber, MJ Ashwin Surface and Interface Analysis: An International Journal devoted to the …, 1997 | 78 | 1997 |
| Depth profiling of fingerprint and ink signals by SIMS and MeV SIMS MJ Bailey, BN Jones, S Hinder, J Watts, S Bleay, RP Webb Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2010 | 73 | 2010 |
| Energy spike generation and quenching processesin ion bombardment induced amorphizationof solids G Carter, DG Armour, SE Donnelly, R Webb Radiation Effects 36 (1-2), 1-13, 1978 | 70 | 1978 |
| Computer-simulated energy and angular distributions of sputtered Cu atoms MH Shapiro, PK Haff, TA Tombrello, DE Harrison Jr, RP Webb Radiation effects 89 (3-4), 243-255, 1985 | 68 | 1985 |
| Unambiguous automatic evaluation of multiple ion beam analysis data with simulated annealing NP Barradas, C Jeynes, RP Webb, U Kreissig, R Grötzschel Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1999 | 67 | 1999 |
| The accumulation of amorphousness as a function of irradiation fluence in a composite model of disorder production G Carter, R Webb Radiation Effects 43 (1), 19-24, 1979 | 66 | 1979 |
| Internal Energy of Molecules Ejected Due to Energetic C60 Bombardment BJ Garrison, Z Postawa, KE Ryan, JC Vickerman, RP Webb, N Winograd Analytical chemistry 81 (6), 2260-2267, 2009 | 65 | 2009 |
| The effects of ion implantation on the interdiffusion coefficients in InxGa1− xAs/GaAs quantum well structures IV Bradley, WP Gillin, KP Homewood, RP Webb Journal of applied physics 73 (4), 1686-1692, 1993 | 63 | 1993 |
| Ion beam analysis: A century of exploiting the electronic and nuclear structure of the atom for materials characterisation C Jeynes, RP Webb, A Lohstroh Reviews of Accelerator Science and Technology 4 (01), 41-82, 2011 | 62 | 2011 |
| Energetic fullerene interactions with a graphite surface R Smith, RP Webb Proceedings of the Royal Society of London. Series A: Mathematical and …, 1993 | 61 | 1993 |
| Rapid, secure drug testing using fingerprint development and paper spray mass spectrometry C Costa, R Webb, V Palitsin, M Ismail, M De Puit, S Atkinson, MJ Bailey Clinical chemistry 63 (11), 1745-1752, 2017 | 59 | 2017 |
| Chemical changes exhibited by latent fingerprints after exposure to vacuum conditions NJ Bright, TR Willson, DJ Driscoll, SM Reddy, RP Webb, S Bleay, NI Ward, ... Forensic science international 230 (1-3), 81-86, 2013 | 59 | 2013 |
| Computer simulation of pit formation in metals by ion bombardment RP Webb, DE Harrison Jr Physical Review Letters 50 (19), 1478, 1983 | 57 | 1983 |
