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Jan Verspecht
Jan Verspecht
Research Engineer, Keysight Technologies, Inc.
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Polyharmonic distortion modeling
DE Root
IEEE microwave magazine 7 (3), 44-57, 2006
4772006
Broad-band poly-harmonic distortion (PHD) behavioral models from fast automated simulations and large-signal vectorial network measurements
DE Root, J Verspecht, D Sharrit, J Wood, A Cognata
IEEE Transactions on Microwave Theory and Techniques 53 (11), 3656-3664, 2005
2572005
X-parameters: characterization, modeling, and design of nonlinear RF and microwave components
DE Root, J Verspecht, J Horn, M Marcu
Cambridge University Press, 2013
1922013
Accurate on wafer measurement of phase and amplitude of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave device
J Verspecht, P Debie, A Barel, L Martens
Proceedings of 1995 IEEE MTT-S International Microwave Symposium, 1029-1032, 1995
1801995
Large-signal network analysis
J Verspecht
IEEE Microwave Magazine 6 (4), 82-92, 2005
1572005
Calibration of a measurement system for high frequency nonlinear devices
J Verspecht
Brussels, Belgium Vrije Univeriteit Brussels, Ph. D. Thesis, 1995
1491995
Calibrated vectorial nonlinear-network analyzers
T Van den Broeck, J Verspecht
1994 IEEE MTT-S International Microwave Symposium Digest (Cat. No. 94CH3389 …, 1994
1421994
Individual characterization of broadband sampling oscilloscopes with a nose-to-nose calibration procedure
J Verspecht, K Rush
IEEE Transactions on instrumentation and measurement 43 (2), 347-354, 1994
1421994
Linearization of large-signal scattering functions
J Verspecht, DF Williams, D Schreurs, KA Remley, MD McKinley
IEEE Transactions on microwave theory and techniques 53 (4), 1369-1376, 2005
1002005
New trends for the nonlinear measurement and modeling of high-power RF transistors and amplifiers with memory effects
P Roblin, DE Root, J Verspecht, Y Ko, JP Teyssier
IEEE Transactions on Microwave Theory and Techniques 60 (6), 1964-1978, 2012
922012
Broadband sampling oscilloscope characterization with the" Nose-to-Nose" calibration procedure: a theoretical and practical analysis
J Verspecht
IEEE Transactions on Instrumentation and Measurement 44 (6), 991-997, 1995
921995
Straightforward and accurate nonlinear device model parameter-estimation method based on vectorial large-signal measurements
DMMP Schreurs, J Verspecht, S Vandenberghe, E Vandamme
IEEE transactions on microwave theory and techniques 50 (10), 2315-2319, 2002
882002
Measurement and control of current/voltage waveforms of microwave transistors using a harmonic load-pull system for the optimum design of high efficiency power amplifiers
D Barataud, F Blache, A Mallet, PP Bouysse, JM Nebus, JP Villotte, ...
IEEE transactions on Instrumentation and Measurement 48 (4), 835-842, 1999
871999
Extension of X-parameters to include long-term dynamic memory effects
J Verspecht, J Horn, L Betts, D Gunyan, R Pollard, C Gillease, DE Root
2009 IEEE MTT-S International Microwave Symposium Digest, 741-744, 2009
762009
Accurately characterizing hard nonlinear behavior of microwave components with the nonlinear network measurement system: Introducing ‘nonlinear scattering functions’
J Verspecht, P Van Esch
Proceedings of the 5th International Workshop on Integrated Nonlinear …, 1998
751998
Multi-tone, multi-port, and dynamic memory enhancements to PHD nonlinear behavioral models from large-signal measurements and simulations
J Verspecht, D Gunyan, J Horn, J Xu, A Cognata, DE Root
2007 IEEE/MTT-S International Microwave Symposium, 969-972, 2007
722007
Direct extraction of the non-linear model for two-port devices from vectorial non-linear network analyzer measurements
D Schreurs, J Verspecht, B Nauwelaers, A Van de Capelle, ...
1997 27th European Microwave Conference 2, 921-926, 1997
641997
Accurate spectral estimation based on measurements with a distorted-timebase digitizer
J Verspecht
1993 IEEE Instrumentation and Measurement Technology Conference, 699-704, 1993
641993
X-parameter measurement and simulation of a GSM handset amplifier
JM Horn, J Verspecht, D Gunyan, L Betts, DE Root, J Eriksson
2008 European Microwave Integrated Circuit Conference, 135-138, 2008
632008
Broad-band, multi-harmonic frequency domain behavioral models from automated large-signal vectorial network measurements
J Verspecht, DE Root, J Wood, A Cognata
IEEE MTT-S International Microwave Symposium Digest, 2005., 1975-1978, 2005
532005
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