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Yong-Bin Kim
Yong-Bin Kim
Northeastern University, University of Utah, SUN Microsystems, HP, Intel
Dirección de correo verificada de ece.neu.edu - Página principal
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CNTFET-based design of ternary logic gates and arithmetic circuits
S Lin, YB Kim, F Lombardi
IEEE transactions on nanotechnology 10 (2), 217-225, 2009
6432009
Challenges for nanoscale MOSFETs and emerging nanoelectronics
YB Kim
transactions on electrical and electronic materials 11 (3), 93-105, 2010
3382010
A novel CNTFET-based ternary logic gate design
S Lin, YB Kim, F Lombardi
2009 52nd IEEE International Midwest Symposium on Circuits and Systems, 435-438, 2009
2072009
Design of a ternary memory cell using CNTFETs
S Lin, YB Kim, F Lombardi
IEEE transactions on nanotechnology 11 (5), 1019-1025, 2012
1692012
A novel design methodology to optimize the speed and power of the CNTFET circuits
YB Kim, YB Kim, F Lombardi
2009 52nd IEEE international midwest symposium on circuits and systems, 1130 …, 2009
1352009
Design of a CNTFET-based SRAM cell by dual-chirality selection
S Lin, YB Kim, F Lombardi
IEEE Transactions on Nanotechnology 9 (1), 30-37, 2009
1252009
Analysis and design of nanoscale CMOS storage elements for single-event hardening with multiple-node upset
S Lin, YB Kim, F Lombardi
IEEE Transactions on Device and Materials Reliability 12 (1), 68-77, 2011
1222011
A CMOS subbandgap reference circuit with 1-V power supply voltage
J Doyle, YJ Lee, YB Kim, H Wilsch, F Lombardi
IEEE Journal of Solid-State Circuits 39 (1), 252-255, 2004
1142004
Standby leakage power reduction technique for nanoscale CMOS VLSI systems
HJ Jeon, YB Kim, M Choi
IEEE transactions on instrumentation and measurement 59 (5), 1127-1133, 2010
1112010
Performance evaluation of CNFET-based logic gates
G Cho, YB Kim, F Lombardi, MS Choi
2009 IEEE Instrumentation and Measurement Technology Conference, 909-912, 2009
1072009
A CMOS low-power low-offset and high-speed fully dynamic latched comparator
HJ Jeon, YB Kim
23rd IEEE International SOC Conference, 285-288, 2010
992010
Design and performance evaluation of radiation hardened latches for nanoscale CMOS
S Lin, YB Kim, F Lombardi
IEEE transactions on very large scale integration (VLSI) systems 19 (7 …, 2010
982010
Leakage minimization technique for nanoscale CMOS VLSI
KK Kim, YB Kim, M Choi, N Park
IEEE Design & Test of Computers 24 (4), 322-330, 2007
902007
A novel low-power, low-offset, and high-speed CMOS dynamic latched comparator
HJ Jeon, YB Kim
Analog Integrated Circuits and Signal Processing 70, 337-346, 2012
852012
A new SRAM cell design using CNTFETs
S Lin, YB Kim, F Lombardi, YJ Lee
2008 International SoC Design Conference 1, I-168-I-171, 2008
852008
Fault tolerant source routing for network-on-chip
YB Kim, YB Kim
22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI …, 2007
842007
Design and analysis of a 32 nm PVT tolerant CMOS SRAM cell for low leakage and high stability
S Lin, YB Kim, F Lombardi
Integration 43 (2), 176-187, 2010
832010
A novel sort error hardened 10T SRAM cells for low voltage operation
IS Jung, YB Kim, F Lombardi
2012 IEEE 55th International Midwest Symposium on Circuits and Systems …, 2012
792012
A 11-transistor nanoscale CMOS memory cell for hardening to soft errors
S Lin, YB Kim, F Lombardi
IEEE transactions on very large scale integration (VLSI) systems 19 (5), 900-904, 2010
782010
Assessment of CNTFET based circuit performance and robustness to PVT variations
G Cho, YB Kim, F Lombardi
2009 52nd IEEE international midwest symposium on circuits and systems, 1106 …, 2009
712009
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