| Calibration of scanning electron microscope using a multi-image non-linear minimization process L Cui, E Marchand 2014 IEEE International Conference on Robotics and Automation (ICRA), 5191-5196, 2014 | 24 | 2014 |
| Three-dimensional visual tracking and pose estimation in scanning electron microscopes L Cui, E Marchand, S Haliyo, S Régnier 2016 IEEE/RSJ International Conference on Intelligent Robots and Systems …, 2016 | 15 | 2016 |
| A joint image quality assessment method based on global phase coherence and structural similarity D Wang, W Ding, Y Man, L Cui 2010 3rd International Congress on Image and Signal Processing 5, 2307-2311, 2010 | 11 | 2010 |
| Scanning electron microscope calibration using a multi-image non-linear minimization process L Cui, É Marchand International Journal of Optomechatronics 9 (2), 151-169, 2015 | 9 | 2015 |
| Closed-loop autofocus scheme for scanning electron microscope L Cui, N Marturi, E Marchand, S Dembélé, N Piat MATEC Web of Conferences 32, 05003, 2015 | 4 | 2015 |
| 6-DoF automatic micropositioning using photometric information L Cui, E Marchand, S Haliyo, S Régnier 2014 IEEE/ASME International Conference on Advanced Intelligent Mechatronics …, 2014 | 4 | 2014 |
| Robust micro/nano-positioning by visual servoing L Cui Université Rennes 1, 2016 | 2 | 2016 |
| Hybrid Automatic Visual Servoing Scheme using Defocus Information for 6-DoF Micropositioning L Cui, E Marchand, S Haliyo, S Régnier Robotics and Automation (ICRA), 2015 IEEE International Conference on, 6025-6030, 2015 | 2 | 2015 |
| Image Quality Assessment Method Based on Support Vector Machine and Genetic Algorithm L Wang, WR Ding, JW Xiang, L Cui Jisuanji Gongcheng/ Computer Engineering 37 (10), 2011 | | 2011 |
| A correlation method of image quality assessment based on SVM and GA L Wang, W Ding, J Xiang, L Cui 2010 3rd International Congress on Image and Signal Processing 1, 6-10, 2010 | | 2010 |
Eric MarchandProfessor of Computer Science, Université de Rennes, Inria, CNRS, IRISAVerified email at irisa.fr
