| Analytical model and parameter extraction to account for the pad parasitics in RF-CMOS R Torres-Torres, R Murphy-Arteaga, JA Reynoso-Hernandez IEEE Transactions on Electron Devices 52 (7), 1335-1342, 2005 | 85 | 2005 |
| MOSFET bias dependent series resistance extraction from RF measurements R Torres-Torres, RS Murphy-Arteaga, S Decoutere Electronics Letters 39 (20), 1476-1478, 2003 | 46 | 2003 |
| On the origin of light emission in silicon rich oxide obtained by low-pressure chemical vapor deposition M Aceves-Mijares, AA González-Fernández, R López-Estopier, ... Journal of Nanomaterials 2012, 2012 | 25 | 2012 |
| RF low-noise amplifiers in BiCMOS technologies F Carreto-Castro, J Silva-Martinez, R Murphy-Arteaga IEEE Transactions on Circuits and Systems II: Analog and Digital Signal …, 1999 | 24 | 1999 |
| Straightforward determination of small-signal model parameters for bulk RF-MOSFETs R Torres-Torres, R Murphy-Arteaga Proceedings of the Fifth IEEE International Caracas Conference on Devices …, 2004 | 23 | 2004 |
| A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters A Ortiz-Conde, A Sucre-González, F Zárate-Rincón, R Torres-Torres, ... Microelectronics Reliability 69, 1-16, 2017 | 22 | 2017 |
| MOSFET gate resistance determination R Torres-Torres, RS Murphy-Arteaga, S Decoutere Electronics Letters 39 (2), 248-250, 2003 | 21 | 2003 |
| Electrical characterization of n-type a-SiGe: H/p-type crystalline-silicon heterojunctions P Rosales-Quintero, A Torres-Jacome, R Murphy-Arteaga, ... Semiconductor science and technology 19 (3), 366, 2003 | 20 | 2003 |
| Impact of technology scaling on the input and output features of RF-MOSFETs: effects and modeling R Torres-Torres, R Murphy-Arteaga, E Augendre, S Decoutere ESSDERC'03. 33rd Conference on European Solid-State Device Research, 2003 …, 2003 | 15 | 2003 |
| A DC method to extract mobility degradation and series resistance of multifinger microwave MOSFETs A Sucre-González, F Zárate-Rincón, A Ortiz-Conde, R Torres-Torres, ... IEEE Transactions on Electron Devices 63 (5), 1821-1826, 2016 | 13 | 2016 |
| Using S-parameter measurements to determine the threshold voltage, gain factor, and mobility degradation factor for microwave bulk-MOSFETs G Álvarez-Botero, R Torres-Torres, R Murphy-Arteaga Microelectronics Reliability 51 (2), 342-349, 2011 | 13 | 2011 |
| Fabrication, characterisation and modelling of integrated on-silicon inductors R Murphy-Arteaga, J Huerta-Chua, A Dı́az-Sánchez, A Torres-Jácome, ... Microelectronics Reliability 43 (2), 195-201, 2003 | 13 | 2003 |
| Characterization of RF-MOSFETs in common-source configuration at different source-to-bulk voltages from S-parameters F Zárate-Rincón, GA Álvarez-Botero, R Torres-Torres, ... IEEE transactions on electron devices 60 (8), 2450-2456, 2013 | 12 | 2013 |
| Modeling the impact of multi-fingering microwave MOSFETs on the source and drain resistances F Zárate-Rincón, RS Murphy-Arteaga, R Torres-Torres, A Ortiz-Conde, ... IEEE Transactions on Microwave Theory and Techniques 62 (12), 3255-3261, 2014 | 11 | 2014 |
| Influence of the thickness on the conduction mechanisms of -amorphous--crystalline-Si heterojunction diodes P Rosales-Quintero, A Torres-Jacome, R Murphy-Arteaga, ... Journal of applied physics 97 (8), 083710, 2005 | 11 | 2005 |
| Characterization of Hot-Carrier-Induced RF-MOSFET Degradation at Different Bulk Biasing Conditions From-Parameters F Zárate-Rincón, D García-García, VH Vega-González, R Torres-Torres, ... IEEE Transactions on Microwave Theory and Techniques 64 (1), 125-132, 2015 | 10 | 2015 |
| A new analytical method to calculate the characteristic impedance ZC of uniform transmission lines JE Zúñiga-Juárez, JA Reynoso-Hernández, ... Computación y Sistemas 16 (3), 277-285, 2012 | 10 | 2012 |
| Conductance-to-current-ratio-based parameter extraction in MOS leakage current models A Ortiz-Conde, A Sucre-González, R Torres-Torres, J Molina, ... IEEE Transactions on Electron Devices 63 (10), 3844-3850, 2016 | 9 | 2016 |
| Consistent DC and RF MOSFET Modeling Using an-Parameter Measurement-Based Parameter Extraction Method in the Linear Region F Zárate-Rincón, R Torres-Torres, RS Murphy-Arteaga IEEE Transactions on Microwave Theory and Techniques 63 (12), 4255-4262, 2015 | 9 | 2015 |
| Improving multi-parameter homotopy via symbolic analysis techniques for circuit simulation H Vázquez-Leal, L Hernández-Martinez, A Sarmiento-Reyes, ... Proceedings of the European Conference on Circuit Theory and Design 2, 402-405, 2003 | 9 | 2003 |
