Roberto Murphy Arteaga
Roberto Murphy Arteaga
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Analytical model and parameter extraction to account for the pad parasitics in RF-CMOS
R Torres-Torres, R Murphy-Arteaga, JA Reynoso-Hernandez
IEEE Transactions on Electron Devices 52 (7), 1335-1342, 2005
MOSFET bias dependent series resistance extraction from RF measurements
R Torres-Torres, RS Murphy-Arteaga, S Decoutere
Electronics Letters 39 (20), 1476-1478, 2003
On the origin of light emission in silicon rich oxide obtained by low-pressure chemical vapor deposition
M Aceves-Mijares, AA González-Fernández, R López-Estopier, ...
Journal of Nanomaterials 2012, 2012
RF low-noise amplifiers in BiCMOS technologies
F Carreto-Castro, J Silva-Martinez, R Murphy-Arteaga
IEEE Transactions on Circuits and Systems II: Analog and Digital Signal …, 1999
Straightforward determination of small-signal model parameters for bulk RF-MOSFETs
R Torres-Torres, R Murphy-Arteaga
Proceedings of the Fifth IEEE International Caracas Conference on Devices …, 2004
A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters
A Ortiz-Conde, A Sucre-González, F Zárate-Rincón, R Torres-Torres, ...
Microelectronics Reliability 69, 1-16, 2017
MOSFET gate resistance determination
R Torres-Torres, RS Murphy-Arteaga, S Decoutere
Electronics Letters 39 (2), 248-250, 2003
Electrical characterization of n-type a-SiGe: H/p-type crystalline-silicon heterojunctions
P Rosales-Quintero, A Torres-Jacome, R Murphy-Arteaga, ...
Semiconductor science and technology 19 (3), 366, 2003
Impact of technology scaling on the input and output features of RF-MOSFETs: effects and modeling
R Torres-Torres, R Murphy-Arteaga, E Augendre, S Decoutere
ESSDERC'03. 33rd Conference on European Solid-State Device Research, 2003 …, 2003
A DC method to extract mobility degradation and series resistance of multifinger microwave MOSFETs
A Sucre-González, F Zárate-Rincón, A Ortiz-Conde, R Torres-Torres, ...
IEEE Transactions on Electron Devices 63 (5), 1821-1826, 2016
Using S-parameter measurements to determine the threshold voltage, gain factor, and mobility degradation factor for microwave bulk-MOSFETs
G Álvarez-Botero, R Torres-Torres, R Murphy-Arteaga
Microelectronics Reliability 51 (2), 342-349, 2011
Fabrication, characterisation and modelling of integrated on-silicon inductors
R Murphy-Arteaga, J Huerta-Chua, A Dı́az-Sánchez, A Torres-Jácome, ...
Microelectronics Reliability 43 (2), 195-201, 2003
Characterization of RF-MOSFETs in common-source configuration at different source-to-bulk voltages from S-parameters
F Zárate-Rincón, GA Álvarez-Botero, R Torres-Torres, ...
IEEE transactions on electron devices 60 (8), 2450-2456, 2013
Modeling the impact of multi-fingering microwave MOSFETs on the source and drain resistances
F Zárate-Rincón, RS Murphy-Arteaga, R Torres-Torres, A Ortiz-Conde, ...
IEEE Transactions on Microwave Theory and Techniques 62 (12), 3255-3261, 2014
Influence of the thickness on the conduction mechanisms of -amorphous--crystalline-Si heterojunction diodes
P Rosales-Quintero, A Torres-Jacome, R Murphy-Arteaga, ...
Journal of applied physics 97 (8), 083710, 2005
Characterization of Hot-Carrier-Induced RF-MOSFET Degradation at Different Bulk Biasing Conditions From-Parameters
F Zárate-Rincón, D García-García, VH Vega-González, R Torres-Torres, ...
IEEE Transactions on Microwave Theory and Techniques 64 (1), 125-132, 2015
A new analytical method to calculate the characteristic impedance ZC of uniform transmission lines
JE Zúñiga-Juárez, JA Reynoso-Hernández, ...
Computación y Sistemas 16 (3), 277-285, 2012
Conductance-to-current-ratio-based parameter extraction in MOS leakage current models
A Ortiz-Conde, A Sucre-González, R Torres-Torres, J Molina, ...
IEEE Transactions on Electron Devices 63 (10), 3844-3850, 2016
Consistent DC and RF MOSFET Modeling Using an-Parameter Measurement-Based Parameter Extraction Method in the Linear Region
F Zárate-Rincón, R Torres-Torres, RS Murphy-Arteaga
IEEE Transactions on Microwave Theory and Techniques 63 (12), 4255-4262, 2015
Improving multi-parameter homotopy via symbolic analysis techniques for circuit simulation
H Vázquez-Leal, L Hernández-Martinez, A Sarmiento-Reyes, ...
Proceedings of the European Conference on Circuit Theory and Design 2, 402-405, 2003
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