Electrostatic correction of structural imperfections present in a microring gyroscope BJ Gallacher, J Hedley, JS Burdess, AJ Harris, A Rickard, DO King Journal of Microelectromechanical Systems 14 (2), 221-234, 2005 | 184 | 2005 |
Laser-scribed graphene presents an opportunity to print a new generation of disposable electrochemical sensors K Griffiths, C Dale, J Hedley, MD Kowal, RB Kaner, N Keegan Nanoscale 6 (22), 13613-13622, 2014 | 152 | 2014 |
Accurate analytical measurements in the atomic force microscope: a microfabricated spring constant standard potentially traceable to the SI PJ Cumpson, J Hedley Nanotechnology 14 (12), 1279, 2003 | 87 | 2003 |
Quantitative analytical atomic force microscopy: a cantilever reference device for easy and accurate AFM spring-constant calibration PJ Cumpson, CA Clifford, J Hedley Measurement Science and Technology 15 (7), 1337, 2004 | 83 | 2004 |
SiC cantilever resonators with electrothermal actuation L Jiang, R Cheung, J Hedley, M Hassan, AJ Harris, JS Burdess, ... Sensors and Actuators A: Physical 128 (2), 376-386, 2006 | 80 | 2006 |
Accurate force measurement in the atomic force microscope: a microfabricated array of reference springs for easy cantilever calibration PJ Cumpson, J Hedley, P Zhdan Nanotechnology 14 (8), 918, 2003 | 78 | 2003 |
Development of a robotic waiter system A Cheong, MWS Lau, E Foo, J Hedley, JW Bo IFAC-PapersOnLine 49 (21), 681-686, 2016 | 76 | 2016 |
Calibration of AFM cantilever stiffness: a microfabricated array of reflective springs PJ Cumpson, P Zhdan, J Hedley Ultramicroscopy 100 (3-4), 241-251, 2004 | 67 | 2004 |
Chemically specific identification of carbon in XPS imaging using Multivariate Auger Feature Imaging (MAFI) AJ Barlow, S Popescu, K Artyushkova, O Scott, N Sano, J Hedley, ... Carbon 107, 190-197, 2016 | 61 | 2016 |
Fractional order PID design based on novel improved slime mould algorithm D Izci, S Ekinci, HL Zeynelgil, J Hedley Electric Power Components and Systems 49 (9-10), 901-918, 2021 | 53 | 2021 |
Characterization of frequency tuning using focused ion beam platinum deposition S Enderling, J Hedley, L Jiang, R Cheung, C Zorman, M Mehregany, ... Journal of Micromechanics and Microengineering 17 (2), 213, 2006 | 52 | 2006 |
Performance evaluation of a novel improved slime mould algorithm for direct current motor and automatic voltage regulator systems D Izci, S Ekinci, HL Zeynelgil, J Hedley Transactions of the Institute of Measurement and Control 44 (2), 435-456, 2022 | 48 | 2022 |
HHO algorithm based PID controller design for aircraft pitch angle control system D Izci, S Ekinci, A Demirören, J Hedley 2020 International Congress on Human-Computer Interaction, Optimization and …, 2020 | 48 | 2020 |
Microelectromechanical device for lateral force calibration in the atomic force microscope: lateral electrical nanobalance PJ Cumpson, J Hedley, CA Clifford Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2005 | 48 | 2005 |
The principle of a MEMS circular diaphragm mass sensor AK Ismail, JS Burdess, AJ Harris, CJ McNeil, J Hedley, SC Chang, ... Journal of micromechanics and microengineering 16 (8), 1487, 2006 | 47 | 2006 |
Multimodal tuning of a vibrating ring using laser ablation BJ Gallacher, J Hedley, JS Burdess, AJ Harris, ME McNie Proceedings of the Institution of Mechanical Engineers, Part C: Journal of …, 2003 | 45 | 2003 |
The fabrication, characterization and testing of a MEMS circular diaphragm mass sensor AK Ismail, JS Burdess, AJ Harris, G Suarez, N Keegan, JA Spoors, ... Journal of Micromechanics and Microengineering 18 (2), 025021, 2008 | 40 | 2008 |
Diamond micro-milling of lithium niobate for sensing applications D Huo, ZJ Choong, Y Shi, J Hedley, Y Zhao Journal of Micromechanics and Microengineering 26 (9), 095005, 2016 | 39 | 2016 |
Electroless nickel deposition: an alternative for graphene contacting SM Popescu, AJ Barlow, S Ramadan, S Ganti, B Ghosh, J Hedley ACS Applied Materials & Interfaces 8 (45), 31359-31367, 2016 | 35 | 2016 |
The construction of a graphene Hall effect magnetometer D Izci, C Dale, N Keegan, J Hedley IEEE Sensors Journal 18 (23), 9534-9541, 2018 | 29 | 2018 |