| Self-heating and equivalent channel temperature in short gate length GaN HEMTs X Chen, S Boumaiza, L Wei IEEE transactions on electron devices 66 (9), 3748-3755, 2019 | 50 | 2019 |
| Fast evaluation of the high-frequency channel noise in nanoscale MOSFETs X Chen, CH Chen, R Lee IEEE Transactions on Electron Devices 65 (4), 1502-1509, 2018 | 21 | 2018 |
| Modeling bias dependence of self-heating in GaN HEMTs using two heat sources X Chen, S Boumaiza, L Wei IEEE Transactions on Electron Devices 67 (8), 3082-3087, 2020 | 19 | 2020 |
| Bias dependence of non-Fourier heat spreading in GaN HEMTs Y Shen, XS Chen, YC Hua, HL Li, L Wei, BY Cao IEEE Transactions on Electron Devices 70 (2), 409-417, 2022 | 14 | 2022 |
| Estimation of MOSFET channel noise and noise performance of CMOS LNAs at cryogenic temperatures X Chen, H Elgabra, CH Chen, J Baugh, L Wei 2021 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2021 | 11 | 2021 |
| Random telegraph noise of a 28-nm cryogenic MOSFET in the coulomb blockade regime HB Yang, M Robitaille, X Chen, H Elgabra, L Wei, NY Kim IEEE Electron Device Letters 43 (1), 5-8, 2021 | 10 | 2021 |
| Extraction of gate resistance in sub-100-nm MOSFETs with statistical verification X Chen, MK Tsai, CH Chen, R Lee, DC Chen IEEE Transactions on Electron Devices 61 (9), 3111-3117, 2014 | 8 | 2014 |
| Short noise suppression factor for nano-scale MOSFETs working in the saturation region X Chen, CH Chen, MJ Deen 2017 International Conference on Noise and Fluctuations (ICNF), 1-4, 2017 | 5 | 2017 |
| Self-heating in short-channel GaN HEMTs: Maximum channel temperature and equivalent channel temperature X Chen, S Boumaiza, L Wei 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM …, 2022 | 3 | 2022 |
| Direct deembedding of noise factors for on-wafer noise measurement X Chen, CH Chen, R Lee, DC Chen, DY Wu IEEE Transactions on Microwave Theory and Techniques 65 (3), 916-922, 2016 | 2 | 2016 |
| Calibration of a noise receiver taking care of its gain variations X Chen, N Misljenovic, B Hosein, CH Chen, C Tsironis 2015 International Conference on Noise and Fluctuations (ICNF), 1-4, 2015 | 2 | 2015 |
| Noise characterization and modeling of nanoscale MOSFETs X Chen | 1 | 2017 |
| Scalable Addressing Circuits for a Surface Code Silicon-based Quantum Computer R Absar, ZD Merino, H Elgabra, X Chen, J Baugh, L Wei Authorea Preprints, 2023 | | 2023 |
| Scalable Addressing Circuits for a Surface Code Quantum Computer in Silicon R Absar, H Elgabra, X Chen, F Sfigakis, J Baugh, L Wei 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2023 | | 2023 |
| Integrated Control Addressing Circuits for a Surface Code Quantum Computer in Silicon R Absar, ZD Merino, H Elgabra, X Chen, J Baugh, L Wei Proceedings of the 17th ACM International Symposium on Nanoscale …, 2022 | | 2022 |
| Coulomb Blockade Phenomena in Random Telegraph Noise of a commercial 28-nm PMOS H Yang, M Robitaille, X Chen, H Elgabra, L Wei, NY Kim APS March Meeting Abstracts 2022, T00. 085, 2022 | | 2022 |
| Recent Advancement in High-Frequency Noise Characterization for Nano-Scale FETs CH Chen, X Chen, PV Do 2018 14th IEEE International Conference on Solid-State and Integrated …, 2018 | | 2018 |
| Future low-noise technologies for RF, analog and mixed-signal integrated circuits CH Chen, X Chen, DY Wu, CS Chen 2015 IEEE 11th International Conference on ASIC (ASICON), 1-4, 2015 | | 2015 |
