| Self-injection locking of a laser diode to a high-Q WGM microresonator NM Kondratiev, VE Lobanov, AV Cherenkov, AS Voloshin, NG Pavlov, ... Optics Express 25 (23), 28167-28178, 2017 | 235 | 2017 |
| Narrow-linewidth lasing and soliton Kerr microcombs with ordinary laser diodes NG Pavlov, S Koptyaev, GV Lihachev, AS Voloshin, AS Gorodnitskiy, ... Nature Photonics 12 (11), 694-698, 2018 | 223 | 2018 |
| Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids J Chalupský, L Juha, J Kuba, J Cihelka, V Hájková, S Koptyaev, J Krása, ... Optics Express 15 (10), 6036-6043, 2007 | 141 | 2007 |
| Soliton dual frequency combs in crystalline microresonators NG Pavlov, G Lihachev, S Koptyaev, E Lucas, M Karpov, NM Kondratiev, ... Optics letters 42 (3), 514-517, 2017 | 134 | 2017 |
| Spectrum collapse, narrow linewidth, and Bogatov effect in diode lasers locked to high-Q optical microresonators RR Galiev, NG Pavlov, NM Kondratiev, S Koptyaev, VE Lobanov, ... Optics express 26 (23), 30509-30522, 2018 | 116 | 2018 |
| Ablation of solids using a femtosecond extreme ultraviolet free electron laser N Stojanovic, D Von Der Linde, K Sokolowski-Tinten, U Zastrau, F Perner, ... Applied Physics Letters 89 (24), 2006 | 59 | 2006 |
| Method for optical inspection of nanoscale objects based upon analysis of their defocused images and features of its practical implementation MV Ryabko, SN Koptyaev, AV Shcherbakov, AD Lantsov, SY Oh Optics Express 21 (21), 24483-24489, 2013 | 23 | 2013 |
| Through-focus scanning optical microscopy (TSOM) considering optical aberrations: practical implementation M Ryabko, A Shchekin, S Koptyaev, A Lantsov, A Medvedev, ... Optics Express 23 (25), 32215-32221, 2015 | 21 | 2015 |
| A high-power laser-driven source of sub-nanosecond soft X-ray pulses for single-shot radiobiology experiments M Davídková, L Juha, M Bittner, S Koptyaev, V Hájková, J Krása, M Pfeifer, ... Radiation research 168 (3), 382-387, 2007 | 21 | 2007 |
| Motion-free all optical inspection system for nanoscale topology control M Ryabko, S Koptyaev, A Shcherbakov, A Lantsov, SY Oh Optics Express 22 (12), 14958-14963, 2014 | 18 | 2014 |
| Interaction of laser radiation with matter. laser plasma: X-ray spectral measurement of high-temperature plasma parameters in porous targets irradiated with high-power laser pulses VV Gavrilov, AY Gol'tsov, NG Koval'skii, SN Koptyaev, AI Magunov, ... Quantum electronics 31 (12), 1071-1074, 2001 | 17 | 2001 |
| Hybrid integrated dual-microcomb source NY Dmitriev, SN Koptyaev, AS Voloshin, NM Kondratiev, KN Min’kov, ... Physical Review Applied 18 (3), 034068, 2022 | 16 | 2022 |
| Pinhole closure in spatial filters of large-scale ICF laser systems RG Bikmatov, CD Boley, IN Burdonsky, VM Chernyak, AV Fedorov, ... Third International Conference on Solid State Lasers for Application to …, 1999 | 14 | 1999 |
| Optical measurement system and method for measuring critical dimension of nanostructure SN Koptyaev, MV Ryabko, MN Rychagov US Patent 9,360,662, 2016 | 11 | 2016 |
| Narrow linewidth diode laser self-injection locked to a high-Q microresonator NG Pavlov, GV Lihachev, AS Voloshin, S Koptyaev, NM Kondratiev, ... AIP Conference Proceedings 1936 (1), 2018 | 10 | 2018 |
| Optical measuring system and method of measuring critical size SN Koptyaev, MV Ryabko, AV Shcherbakov, AD Lantsov US Patent 9,322,640, 2016 | 7 | 2016 |
| Experimental Study of Laser Interaction with Fibrous and Foam‐Like Materials AE Bugrov, IN Burdonskiy, OL Dedova, IK Fasakhov, VV Gavrilov, ... Contributions to Plasma Physics 45 (3‐4), 185-191, 2005 | 7 | 2005 |
| Ablation of organic molecular solids by focused soft X-ray free-electron laser radiation J Chalupský, L Juha, J Kuba, J Cihelka, V Hájková, M Bergh, RM Bionta, ... X-Ray Lasers 2006: Proceedings of the 10th International Conference, 503-510, 2007 | 6 | 2007 |
| Optical dual-comb source apparatuses including optical microresonator SN Koptyaev, GV Lihachev, NG Pavlov, AA Shchekin, IA Bilenko, ... US Patent 10,224,688, 2019 | 5 | 2019 |
| Improved critical dimension inspection for the semiconductor industry M Ryabko, S Koptyev, A Shchekin, A Medvedev SPIE Newsroom 5515, 2014 | 4 | 2014 |
Andrey VoloshinEPFLDirección de correo verificada de physics.msu.ru
