| Nonlinear dispersive modeling of electron devices oriented to GaN power amplifier design A Raffo, V Vadalà, DMMP Schreurs, G Crupi, G Avolio, A Caddemi, ... Microwave Theory and Techniques, IEEE Transactions on 58 (4), 710-718, 2010 | 123 | 2010 |
| Behavioral Modeling of GaN FETs: A Load-Line Approach A Raffo, G Bosi, V Vadalà, G Vannini IEEE, 2014 | 79 | 2014 |
| Characterization of GaN HEMT low-frequency dispersion through a multiharmonic measurement system A Raffo, S Di Falco, V Vadalà, G Vannini IEEE Transactions on Microwave Theory and Techniques 58 (9), 2490-2496, 2010 | 79 | 2010 |
| A Load-Pull Characterization Technique Accounting for Harmonic Tuning V Vadalà, A Raffo, S Di Falco, G Bosi, A Nalli, G Vannini IEEE Transactions on Microwave Theory and Techniques 61 (7), 2695-2704, 2013 | 66 | 2013 |
| X-band GaN power amplifier for future generation SAR systems D Resca, A Raffo, S Di Falco, F Scappaviva, V Vadalà, G Vannini IEEE Microwave and Wireless Components Letters 24 (4), 266-268, 2014 | 52 | 2014 |
| Empowering GaN HEMT models: The gateway for power amplifier design G Crupi, V Vadalà, P Colantonio, E Cipriani, A Caddemi, G Vannini, ... International Journal of Numerical Modelling: Electronic Networks, Devices …, 2017 | 42 | 2017 |
| Accurate GaN HEMT nonquasi‐static large‐signal model including dispersive effects G Crupi, A Raffo, DMMP Schreurs, G Avolio, V Vadalà, S Di Falco, ... Microwave and Optical Technology Letters 53 (3), 692-697, 2011 | 38 | 2011 |
| A new modeling technique for microwave multicell transistors based on EM simulations A Raffo, V Vadalà, H Yamamoto, K Kikuchi, G Bosi, N Ui, K Inoue, ... IEEE Transactions on Microwave Theory and Techniques 68 (7), 3100-3110, 2020 | 29 | 2020 |
| High-periphery GaN HEMT modeling up to 65 GHz and 200° C G Crupi, A Raffo, V Vadalà, G Vannini, A Caddemi Solid-State Electronics 152, 11-16, 2019 | 28 | 2019 |
| Millimeter-wave FET nonlinear modelling based on the dynamic-bias measurement technique G Avolio, A Raffo, I Angelov, V Vadalà, G Crupi, A Caddemi, G Vannini, ... IEEE Transactions on Microwave Theory and Techniques 62 (11), 2526-2537, 2014 | 27 | 2014 |
| Nonlinear embedding and de‐embedding techniques for large‐signal fet measurements V Vadalà, G Avolio, A Raffo, DMMP Schreurs, G Vannini Microwave and Optical Technology Letters 54 (12), 2835-2838, 2012 | 22 | 2012 |
| Broadband 3-D shared aperture high isolation nine-element antenna array for on-demand millimeter-wave 5G applications M Alibakhshikenari, BS Virdee, V Vadalà, M Dalarsson, ... Optik 267, 169708, 2022 | 21 | 2022 |
| Technology-Independent Analysis of the Double Current-Gain Peak in Millimeter-Wave FETs G Crupi, A Raffo, V Vadalà, G Avolio, DMMP Schreurs, G Vannini, ... IEEE Microwave and Wireless Components Letters 28 (4), 326-328, 2018 | 21 | 2018 |
| Nonlinear-Embedding Design Methodology Oriented to LDMOS Power Amplifiers G Bosi, A Raffo, F Trevisan, V Vadalà, G Crupi, G Vannini IEEE Transactions on Power Electronics 33 (10), 8764-8774, 2018 | 19 | 2018 |
| Dynamic-Bias S-Parameters: A New Measurement Technique for Microwave Transistors G Avolio, A Raffo, V Vadalà, G Vannini, DMMP Schreurs IEEE Transactions on Microwave Theory and Techniques 64 (11), 3946-3955, 2016 | 19 | 2016 |
| A New Study on the Temperature and Bias Dependence of the Kink Effects in S22 and h21 for the GaN HEMT Technology G Crupi, A Raffo, V Vadalà, G Vannini, A Caddemi Electronics 7 (12), 353, 2018 | 18 | 2018 |
| Waveform engineering: State‐of‐the‐art and future trends A Raffo, V Vadalà, G Bosi, F Trevisan, G Avolio, G Vannini International Journal of RF and Microwave Computer‐Aided Engineering 27 (1 …, 2017 | 17 | 2017 |
| A new approach to class-E power amplifier design A Musio, V Vadalà, F Scappaviva, A Raffo, S Di Falco, G Vannini 2011 Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits …, 2011 | 17 | 2011 |
| Assessing GaN FET Performance Degradation in Power Amplifiers for Pulsed Radar Systems A Raffo, G Avolio, V Vadalà, G Bosi, G Vannini, D Schreurs IEEE Microwave and Wireless Components Letters 28 (11), 1035-1037, 2018 | 16 | 2018 |
| A New Dynamic-Bias Measurement Setup for Nonlinear Transistor Model Identification V Vadalà, A Raffo, G Avolio, M Marchetti, DMMP Schreurs, G Vannini IEEE Transactions on Microwave Theory and Techniques 65 (1), 218-228, 2017 | 16 | 2017 |
Giovanni CrupiUniversity of MessinaDirección de correo verificada de unime.it
